搜索包含 Symposium on Semiconductor Memory Testing (1973 : Cherry Hill) 的图书 - 暨南大学图书馆

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	IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973 0 索取号：TN102-53/E801/11 作者：Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、出版社：New York, N.Y. : IEEE, c1973.		Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	Statistical sampling : past, present, and future theoretical and practical 0 索取号：作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、出版社：Philadelphia, PA : ASTM, c1990.		1975 IEEE MTT-S International Microwave Symposium : digest of technical papers 0 索取号：TN019.2-7/E801/1975 作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
	1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL 0 索取号：TN019.2/E806/1972 作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、出版社：New York : Institute of Electrical and Electronics Engineers, 1972.		Proceedings : TENCON 87, 1987 IEEE Region 10 conference : "computers and communications technology toward 2000" ; August 25-28, 1987, Sheraton Walker Hill Hotel, Seoul, Korea 0 索取号：TN-53/E901 作者：Trends in Electronics Conference (3rd : 1987 : Seoul、 Korea)、Institute of Electrical and Electronics Engineers. Korea Section.、IEEE Region 10.、Taehan Chŏnja Konghakhoe.、出版社：[New York : Institute of Electrical and Electronics Engineers, 1987]
	1973 IEEE/OSA Conference on Laser Engineering and Applications : digest of technical papers 0 索取号：TN24-7/E801/1973 作者：IEEE/OSA Conference on Laser Engineering and Applications (1973 : Wash.)、IEEE Quantum Electronics Council.、Optical Society of America.、出版社：New York : IEEE, c1973.		High-speed semiconductor devices 0 索取号：TN303/E992 作者：出版社：New York : Wiley, c1990.
	Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology 0 索取号：TN304.1-53/E801/3 作者：International Symposium on Silicon Materials Science and Technology (3rd : 1977 : Philadelphia、 Pa.)、Huff、 Howard R.、Sirtl、 Erhard.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、出版社：Princeton, N.J. : Electronics and Electrothermics and Metallurgy Divisions, Electrochemical Society, c1977.		Physics and applications of semiconductor microstructures 0 索取号：TN301/E901 作者：Jaros、 M.、出版社：Oxford [England] : Clarendon Press ; New York : Oxford University Press, 1989.
	Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973 0 索取号：TN153-53/E802/31 作者：Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、出版社：Baton Rouge : Claitor's Publishing Division, 1973.		Boron: synthesis, structure, and properties : proceedings of the conference on Boron 0 索取号：TN304.16-53/E701 作者：International Symposium on Boron (1st : 1959 : Asbury Park、 N.J.)、GauĺЕ、 G. K. (Gerhart K.)、Nye、 W. F. (William Frederick)、 1917-、Kohn、 J. A. (Jack Arnold)、 1925-、　Institute for Exploratory Research (U.S.)、出版社：New York : Plenum Press, 1960.

	IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973 0 索取号：TN102-53/E801/11 作者：Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、出版社：New York, N.Y. : IEEE, c1973.		Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	Statistical sampling : past, present, and future theoretical and practical 0 索取号：作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、出版社：Philadelphia, PA : ASTM, c1990.		1975 IEEE MTT-S International Microwave Symposium : digest of technical papers 0 索取号：TN019.2-7/E801/1975 作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
	1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL 0 索取号：TN019.2/E806/1972 作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、出版社：New York : Institute of Electrical and Electronics Engineers, 1972.		Proceedings : TENCON 87, 1987 IEEE Region 10 conference : "computers and communications technology toward 2000" ; August 25-28, 1987, Sheraton Walker Hill Hotel, Seoul, Korea 0 索取号：TN-53/E901 作者：Trends in Electronics Conference (3rd : 1987 : Seoul、 Korea)、Institute of Electrical and Electronics Engineers. Korea Section.、IEEE Region 10.、Taehan Chŏnja Konghakhoe.、出版社：[New York : Institute of Electrical and Electronics Engineers, 1987]
	1973 IEEE/OSA Conference on Laser Engineering and Applications : digest of technical papers 0 索取号：TN24-7/E801/1973 作者：IEEE/OSA Conference on Laser Engineering and Applications (1973 : Wash.)、IEEE Quantum Electronics Council.、Optical Society of America.、出版社：New York : IEEE, c1973.		High-speed semiconductor devices 0 索取号：TN303/E992 作者：出版社：New York : Wiley, c1990.
	Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology 0 索取号：TN304.1-53/E801/3 作者：International Symposium on Silicon Materials Science and Technology (3rd : 1977 : Philadelphia、 Pa.)、Huff、 Howard R.、Sirtl、 Erhard.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、出版社：Princeton, N.J. : Electronics and Electrothermics and Metallurgy Divisions, Electrochemical Society, c1977.		Physics and applications of semiconductor microstructures 0 索取号：TN301/E901 作者：Jaros、 M.、出版社：Oxford [England] : Clarendon Press ; New York : Oxford University Press, 1989.
	Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973 0 索取号：TN153-53/E802/31 作者：Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、出版社：Baton Rouge : Claitor's Publishing Division, 1973.		Boron: synthesis, structure, and properties : proceedings of the conference on Boron 0 索取号：TN304.16-53/E701 作者：International Symposium on Boron (1st : 1959 : Asbury Park、 N.J.)、GauĺЕ、 G. K. (Gerhart K.)、Nye、 W. F. (William Frederick)、 1917-、Kohn、 J. A. (Jack Arnold)、 1925-、　Institute for Exploratory Research (U.S.)、出版社：New York : Plenum Press, 1960.